trustmebro.to/r/…
✓ checked
trust me, bro:
here is the receipt.
the claim

Electrostatic discharge damages integrated circuits and other sensitive electronic components.

the verdict
SUPPORTED
the evidence backs this
Recorded sources
7 sources for · 0 against

Counts group repeated records of the same source within each side. They do not measure evidence strength or source independence.

Is it true that electrostatic discharge damages integrated circuits and other sensitive electronic components?

Yes. A reference article and a peer-reviewed tutorial state directly that electrostatic discharge causes failure and permanent damage to integrated circuits and other electronic components; several further peer-reviewed papers report ESD damage to specific device types such as MMICs and semiconductor packages.

Verdict: SUPPORTED · 7 sources for, 0 against · Last checked

The private library was unavailable for some searches in this check. Missing library results are not evidence against the claim.

Evidence for · 7
Electrostatic discharge
Get citation
Electrostatic discharge. (n.d.). en.wikipedia.org. https://en.wikipedia.org/wiki/Electrostatic_discharge

See more details
More for · 6
Electrostatic discharge on ungrounded components
2020
Get citation
Electrostatic discharge on ungrounded components. (2020). electronics.stackexchange.com. https://electronics.stackexchange.com/questions/501021/electrostatic-discharge-on-ungrounded-components

Tutorial sessions: Electrostatic discharge protection of consumer electronics: Challenges and solutions
2017
Get citation
Tutorial sessions: Electrostatic discharge protection of consumer electronics: Challenges and solutions. (2017). doi.org. https://doi.org/10.1109/asicon.2017.8252395

Methodology to Evaluate the Robustness of Integrated Circuits under Cable Discharge Event
2006
Get citation
Methodology to Evaluate the Robustness of Integrated Circuits under Cable Discharge Event. (2006). doi.org. https://doi.org/10.1109/edssc.2005.1635317

Method to Evaluate Cable Discharge Event (CDE) Reliability of Integrated Circuits in CMOS Technology
2006
Get citation
Method to Evaluate Cable Discharge Event (CDE) Reliability of Integrated Circuits in CMOS Technology. (2006). doi.org. https://doi.org/10.1109/isqed.2006.85

Evaluation of biasing and protection circuitry components for cryogenic MMIC low-noise amplifiers
2014
Get citation
W., L. J. (2014). Evaluation of biasing and protection circuitry components for cryogenic MMIC low-noise amplifiers. authors.library.caltech.edu. https://doi.org/10.1016/j.cryogenics.2014.02.005

Electrostatic Discharge (ESD) Damage Simulation on RF MMIC Device
Get citation
Electrostatic Discharge (ESD) Damage Simulation on RF MMIC Device. (n.d.). cir.nii.ac.jp. https://doi.org/10.31399/asm.cp.istfa2004p0660

Receipt History
Anyone with this link can read the claim and its public receipt, including any personal information in that text. Open permanent receipt.
Check your own claim
Challenge the receipt
Requests are recorded for review. This does not start an automatic check or guarantee a response time.

Citation formatting by citeproc-js (Frank Bennett) and the Citation Style Language project. Source and licenses.

This receipt is an automated verdict against our published method · not an opinion about any author or publication.
Terms · Privacy · How verdicts work